CPM Seminar

Typically, the sign of the polarization of a domain in a ferroelectric crystal cannot be distinguished with ordinary structure analysis because of Friedel's law of crystallography. However, we find that the distribution of domain polarity in an epitaxial ferroelectric film has considerable effects on the shape of the scattering profile, due to interference between the x-ray scattering from film and substrate. X-ray scattering measurements of epitaxial PbTiO₃ films grown by metal-organic chemical vapor deposition on SrTiO₃ substrates are presented. Results suggest that the 10nm films grow with a single polarity.

Thursday, March 12th, 13:15
Ernest Rutherford Physics Building, Boardroom (105)