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CPM Seminar
Timothy Stowe Stanford University A new configuration for non-contact imaging in vacuum has been investigated in which a cantilever beam is placed perpendicular to a substrate and the tip is vibrated parallel to the substrate. This geometry is similar to STM and NSOM configurations but uses extremely low spring constant microfabricated cantilevers to image lateral force gradients near the surface without snap-in problems. A surprising amount of surface information can be obtained from these measurements. I will examine the use of this configuration to detect trapped charge in insulators, electrical dissipation in semiconductors, as well as attempts to achieve single electron spin detection using magnetic resonance force microscopy (MRFM). In addition to discussing this experimental geometry, I will review the design and fabrication of new scanning probe geometries as well as plans to improve the mechanical quality factor of scanning probes using surface treatments and in-situ annealing techniques.
Thursday, March 25th 1999, 15:30 |