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CPM Seminar
Zin Tun NRC/Chalk River Laboratories Within the last ten years, significant improvements in neutron reflectometry have made the technique an important tool in study of surfaces and interfaces. More recently, the technique is increasingly applied to study chemical or physical processes in-situ. I will describe how versatile in-situ neutron reflectometry could be, and what kinds of sample environments are possible. As a specific example, I will report a recent experiment we carried out at Chalk River, on a Ti thin-film electrode exposed to aqueous solution. By observing how the original protective oxide layer gets thicker under an applied anodic potential, we could identify the underlying ion transport mechanism. Subsequent application of cathodic potential shows what attributes are essential for a protective oxide layer to be effective against hydrogen ingress.
Wednesday, November 4th 1998, 15:30 |