CPM Seminar
Nanoscale electrical probing for large area organic
electronics
Jeff Mativetsky
Department of Chemical and Biological Engineering Princeton University
Mechanical flexibility, light weight, ease of processing, and low cost are
some of the advantages associated with organic materials. With the aim of
imparting these features to large-scale electronics, such as solar cells and
display technologies, electrically conductive organic materials are gaining
significant attention.
The electrical performance of organic systems is critically impacted by
molecular organization at multiple length scales. One way to introduce
molecular order is to make use of supramolecular (i.e. non-covalent)
interactions. We have developed post-deposition treatments for promoting
supramolecular assembly and guiding crystallization, making it possible to
engineer model systems and systematically test transport across single grain
boundaries. We have also induced the assembly of nano- and micro-fibres and
explored their use, at the single fibre and ensemble level, as components in
organic field effect transistors.
To correlate structural and electrical characteristics over nanometer to
micrometer scales we are using conductive atomic force microscopy (C-AFM)
[1]. This technique makes use of a sharp metallic tip which serves as a
movable electrical contact capable of nanometer-scale positional control and
minimally invasive, nano-newton-range forces. I will also present recent
results where we establish C-AFM as a tool for patterning conductive
graphene pathways on otherwise insulating graphene oxide [2].
[1] J. M. Mativetsky, M. Palma, and P. Samor�, Topics in
Current Chemistry 285, 157 (2008).
[2] J. M. Mativetsky, E. Treossi, E. Orgiu, et al.,
Journal of the American Chemical Society 132, 14130 (2010).
Thursday, November 10th 2011, 15:30
Ernest Rutherford Physics Building, R.E. Bell Conference Room (room 103)
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