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CPM SeminarUsing X-ray Intensity Fluctuation Spectroscopy to Test Dynamical ScalingMark SuttonMcGill UniversityDynamical scaling is a natural extension of the ideas of scaling seen near equilibrium critical points. X-ray intensity fluctuation spectroscopy (XIFS) is a technique that gives direct information on the fluctuations in a thermodynamical system and provides a unique tool with which to test dynamical scaling. In particular, I will discuss how the measurement of two-time correlation functions after a quench through a first order phase transition presents a new test of dynamical scaling and present our results for both conserved and non-conserved systems.
Thursday, October 6th 2005, 15:30
Ernest Rutherford Physics Building, R.E. Bell Conference Room (room 103) |